US Patent Issued to UDMTEK on Jan. 13 for "Graph neural network based PLC control logic automatic inspection method" (South Korean Inventors)

ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,523,978, issued on Jan. 13, was assigned to UDMTEK Co. LTD. (Suwon-Si, South Korea).

"Graph neural network based PLC control logic automatic inspection method" was invented by Gi Nam Wang (Yongin-Si, South Korea), Jun Pyo Park (Suwon-Si, South Korea), Sang Chul Yoo (Osan-Si, South Korea), Kang Hee Han (Suwon-Si, South Korea), Seung Woo Han (Hwaseong-Si, South Korea), Yeon Dong Kim (Suwon-si, South Korea) and Nam Ki Kim (Suwon-Si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method of inspecting a programmable logic controller (PLC) control logic using a graphic neural network (GNN) generally includes three operations: a data preprocessin...