US Patent Issued to U.S. Department OF Energy on Nov. 4 for "Substrates for optical and electron microscopy of 2D materials" (New York Inventors)

ALEXANDRIA, Va., Nov. 6 -- United States Patent no. 12,463,032, issued on Nov. 4, was assigned to U.S. Department OF Energy (Washington).

"Substrates for optical and electron microscopy of 2D materials" was invented by Jerzy T Sadowski (Upton, N.Y.), Chang-Yong Nam (Upton, N.Y.), Nikhil Tiwale (Upton, N.Y.), Ashwanth Subramanian (Upton, N.Y.), Zhongwei Dai (Upton, N.Y.) and Mingxing Li (Upton, N.Y.).

According to the abstract* released by the U.S. Patent & Trademark Office: "One or more embodiments relates to a substrate consisting of an ultrathin, conductive, shapeless metal oxide on SiO2/Si substrate. In one embodiment, the substrate facilitates experimental characterization of 2D materials simultaneously via optical identification of t...