ALEXANDRIA, Va., Sept. 17 -- United States Patent no. 12,415,619, issued on Sept. 16, was assigned to Twin Coast Metrology Inc. (Forth Worth, Texas).
"Metrological inspection system for aircraft" was invented by Eric James Stone (Fort Worth, Texas).
According to the abstract* released by the U.S. Patent & Trademark Office: "A method and system for inspecting an aircraft for defects. The system comprises a plurality of cameras and projectors mounted on a structural inspection frame for imaging substantially the entire exterior surface of the aircraft. The projectors can project structured light patterns onto an exterior surface of the aircraft so that the camera system can capture a three-dimensional map of the exterior surface of the airc...