US Patent Issued to TSINGHUA UNIVERSITY on Aug. 12 for "Electron ptychography method and apparatus for automatically correcting mistilt of zone axis of sample" (Chinese Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,385,859, issued on Aug. 12, was assigned to TSINGHUA UNIVERSITY (Beijing).

"Electron ptychography method and apparatus for automatically correcting mistilt of zone axis of sample" was invented by Rong Yu (Beijing), Hao-Zhi Sha (Beijing) and Ji-Zhe Cui (Beijing).

According to the abstract* released by the U.S. Patent & Trademark Office: "An electron ptychography method and an electron ptychography apparatus for automatically correcting a mistilt of a zone axis of a sample. The method includes: acquiring a diffraction pattern of each scan point of the sample by scanning the sample through using an electron beam; initializing an object function and an electron beam function, constructin...