US Patent Issued to TSINGHUA UNIVERSITY on April 8 for "High-resolution phase detection method and system based on plane grating laser interferometer" (Chinese Inventors)

ALEXANDRIA, Va., April 9 -- United States Patent no. 12,270,645, issued on April 8, was assigned to TSINGHUA UNIVERSITY (Beijing).

"High-resolution phase detection method and system based on plane grating laser interferometer" was invented by Yu Zhu (Beijing), Jinchun Hu (Beijing), Rujin Han (Beijing), Chang Tian (Beijing), Ming Zhang (Beijing), Wensheng Yin (Beijing), Rong Cheng (Beijing) and Dengfeng Xu (Beijing).

According to the abstract* released by the U.S. Patent & Trademark Office: "A high-resolution phase detection method and system based on a plane grating laser interferometer. The method uses a dual-frequency interferometer to measure the displacement, and the measurement signal processing comprises an integral part and a decim...