US Patent Issued to TSINGHUA UNIVERSITY, Nuctech on Oct. 7 for "Imaging system and method for radiographic inspection" (Chinese Inventors)

ALEXANDRIA, Va., Oct. 8 -- United States Patent no. 12,437,397, issued on Oct. 7, was assigned to TSINGHUA UNIVERSITY (Beijing) and Nuctech Co. Ltd. (Beijing).

"Imaging system and method for radiographic inspection" was invented by Zhiqiang Chen (Beijing), Li Zhang (Beijing), Xin Jin (Beijing), Hongkai Yang (Beijing), Xiaofei Xu (Beijing), Zhenhua Zhao (Beijing), Siyuan Zhang (Beijing) and Changyu Chen (Beijing).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure relates to an imaging system and method for radiographic inspection. The imaging system for radiographic inspection includes an inspection area including an imaging area; a first ray source assembly, all the first targets of which a...