US Patent Issued to Tsinghua University, Nuctech on June 24 for "Electromagnetic imaging device for active microwave and millimeter wave security inspection apparatus" (Chinese Inventors)

ALEXANDRIA, Va., June 25 -- United States Patent no. 12,339,352, issued on June 24, was assigned to Tsinghua University (Beijing) and Nuctech Co. Ltd. (Beijing).

"Electromagnetic imaging device for active microwave and millimeter wave security inspection apparatus" was invented by Ziran Zhao (Beijing), Yan You (Beijing), Yuanjing Li (Beijing), Xuming Ma (Beijing) and Jian Wu (Beijing).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure provides an electromagnetic imaging device for an active microwave and millimeter wave security inspection apparatus, including: a two-dimensional multiple-input multiple-output array panel including at least one sub-array, wherein each sub-array includes a pl...