US Patent Issued to TSINGHUA UNIVERSITY, Nuctech, NuRay Technology on Sept. 9 for "Deflection electrode assembly, X-ray source, and X-ray imaging system" (Chinese Inventors)

ALEXANDRIA, Va., Sept. 10 -- United States Patent no. 12,408,880, issued on Sept. 9, was assigned to TSINGHUA UNIVERSITY (China), Nuctech Co. Ltd. (China) and NuRay Technology Co. Ltd. (China).

"Deflection electrode assembly, X-ray source, and X-ray imaging system" was invented by Zhiqiang Chen (Beijing), Huaping Tang (Beijing) and Xin Jin (Beijing).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present application relates to a deflection electrode assembly, an X-ray source, and an X-ray imaging system. The deflection electrode assembly includes: a first electrode plate, including a first connection portion and a plurality of first tooth portions, wherein the first electrode plate is formed as a comb shap...