US Patent Issued to Tsinghua University, Beijing U-Precision Tech on June 17 for "Heterodyne grating interferometry system based on secondary diffraction" (Chinese Inventors)

ALEXANDRIA, Va., June 19 -- United States Patent no. 12,332,053, issued on June 17, was assigned to Tsinghua University (Beijing) and Beijing U-Precision Tech Co. Ltd. (Beijing).

"Heterodyne grating interferometry system based on secondary diffraction" was invented by Yu Zhu (Beijing), Leijie Wang (Beijing), Ziwen Guo (Beijing), Ming Zhang (Beijing), Rong Cheng (Beijing), Weinan Ye (Beijing) and Zhaokui Cheng (Beijing).

According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed is a heterodyne grating interferometry system based on secondary diffraction, including a single-frequency laser, an input optical fiber, an acousto-optic modulator, a reading head, and a measurement grating, an output optical fiber, a ph...