US Patent Issued to Trustees of Boston University on July 8 for "Apparatus and method for shortwave infrared photothermal (SWIP) microscopy" (Massachusetts Inventors)

ALEXANDRIA, Va., July 9 -- United States Patent no. 12,352,944, issued on July 8, was assigned to Trustees of Boston University (Boston).

"Apparatus and method for shortwave infrared photothermal (SWIP) microscopy" was invented by Ji-Xin Cheng (Newton, Mass.), Hongli Ni (Boston) and Yuhao Yuan (Waltham, Mass.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A short-wave infrared photothermal (SWIP) microscopy system and method for vibrational imaging of a sample generates shortwave infrared excitation light probe light. The excitation light and the probe light are combined to generate a combined beam, which is focused to generate a focused combined beam, which is directed onto the sample to obtain a SWIP signa...