US Patent Issued to TRON FUTURE TECH on July 1 for "Method and system for testing phased array antenna with independent signal calibration" (Taiwanese Inventors)

ALEXANDRIA, Va., July 3 -- United States Patent no. 12,345,751, issued on July 1, was assigned to TRON FUTURE TECH INC. (Hsinchu, Taiwan).

"Method and system for testing phased array antenna with independent signal calibration" was invented by Li Han Chang (Hsinchu, Taiwan) and Yu-Jiu Wang (Hsinchu, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method of testing an antenna array includes: receiving a probe needle set and a shielding structure, wherein the shielding structure includes an array of conductive pads. The antenna array includes a substrate and an array of antenna devices. Each of the antenna devices includes: a first and a second slits; a first and a second signal ports; a first and a se...