US Patent Issued to TRIPLE WIN TECHNOLOGY(SHENZHEN) on Sept. 23 for "Three-dimensional contour measurement system" (Taiwanese Inventor)

ALEXANDRIA, Va., Sept. 23 -- United States Patent no. 12,422,253, issued on Sept. 23, was assigned to TRIPLE WIN TECHNOLOGY(SHENZHEN) Co. LTD. (Shenzhen, China).

"Three-dimensional contour measurement system" was invented by Hsuan-Wei Ho (New Taipei, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed in the present application is a three-dimensional (3D) contour measurement system. The 3D contour measurement system includes a light source unit, an image acquisition unit, and a control device. The light source unit emits light beam, the light source modulation unit modulates the light beam into a structured light with a preset frequency. The image acquisition unit acquires a stripe image of the o...