ALEXANDRIA, Va., Dec. 9 -- United States Patent no. 12,492,982, issued on Dec. 9, was assigned to TRINAMIX GMBH (Ludwigshafen am Rhein, Germany).
"Enhanced material detection by stereo beam profile analysis" was invented by Patrick Schindler (Ludwigshafen am Rhein, Germany), Ruben Huehnerbein (Ludwigshafen am Rhein, Germany), Christian Lennartz (Ludwigshafen am Rhein, Germany) and Jakob Unger (Freiburg im Breisgau, Germany).
According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed herein is a detector for determining at least one material property of at least one object. The detector includes at least one projector configured for illuminating the object with at least one illumination pattern including a plural...