ALEXANDRIA, Va., Jan. 20 -- United States Patent no. 12,530,636, issued on Jan. 20, was assigned to Transportation IP Holdings LLC (Norwalk, Conn.).
"System and method for vehicle defect detection" was invented by Somnath Barole (Bangalore, India), Rithesh M (Bangalore, India), Vishram Nandedkar (Bangalore, India), Krishnamurthy Vaidyanathan (Bangalore, India), James D Brooks (Grove City, Pa.), Guangliang Zhao (Niskayuna, N.Y.), Weina Ge (San Ramon, Calif.), Peter Tu (Niskayuna, N.Y.), Derek K. Woo (Melbourne, Fla.), Daniel J. Rush (Saint Charles, Ill.) and Adam Franco (Melbourne, Fla.).
According to the abstract* released by the U.S. Patent & Trademark Office: "A defect detection system includes one or more route optical sensors configur...