US Patent Issued to TOYOTA JIDOSHA on Nov. 11 for "Abnormality inspection system and method for detecting abnormality of curved component using two different learning models" (Japanese Inventors)

ALEXANDRIA, Va., Nov. 11 -- United States Patent no. 12,469,121, issued on Nov. 11, was assigned to TOYOTA JIDOSHA K.K. (Toyota, Japan).

"Abnormality inspection system and method for detecting abnormality of curved component using two different learning models" was invented by Akihiro Kajino (Miyoshi, Japan) and Haruka Tai (Toyota, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An abnormality inspection system S1 according to an embodiment includes: an image acquisition unit configured to acquire a plurality of pieces of continuous pickup data of a component such that an identical spot of the component is contained in mutually different regions of the plurality of pieces of continuous pickup data; and ...