ALEXANDRIA, Va., June 17 -- United States Patent no. 12,313,564, issued on May 27, was assigned to TOYOTA JIDOSHA K.K. (Toyota, Japan).
"Inspection device and inspection method" was invented by Tomohiro Matsuda (Toyota, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "An inspection device includes: a first acquisition unit for acquiring a first defect probability calculated using a first learning model from data regarding an inspection target processed in a first manufacturing process; a second acquisition unit for acquiring a second defect probability calculated using a second learning model from data regarding the inspection target processed in a second manufacturing process after the first manufacturi...