ALEXANDRIA, Va., Dec. 31 -- United States Patent no. 12,510,593, issued on Dec. 30, was assigned to TouchNetix AS (Trondheim, Norway).

"Integrated circuit testing method and system" was invented by Steinar Myren (Trondheim, Norway).

According to the abstract* released by the U.S. Patent & Trademark Office: "Described is a method for connectivity testing of integrated circuits. The method includes connecting an integrated circuit comprising an internal measurement component and a plurality of connection elements to an automated testing apparatus via a first common test channel connected to a first set of non-neighbouring connection elements of the plurality of connection elements and a second common test channel connected to a second set o...