US Patent Issued to TOPPAN PRINTING on July 29 for "Analysis devices, analysis kits, and analysis systems" (Japanese Inventors)

ALEXANDRIA, Va., July 30 -- United States Patent no. 12,370,545, issued on July 29, was assigned to TOPPAN PRINTING Co. Ltd. (Tokyo).

"Analysis devices, analysis kits, and analysis systems" was invented by Yoichi Makino (Taito-ku, Japan), Akihiro Hoshino (Taito-ku, Japan), Tomoko Kunitomi (Taito-ku, Japan), Keisuke Goto (Taito-ku, Japan) and Yosuke Horiuchi (Taito-ku, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An analysis apparatus including a stage, an analysis device placed on the stage and including receiving sections which accommodate a sample and a reagent for biochemical reaction, and are communicated with one another through a flow path having an inlet and an outlet, a liquid introduction se...