US Patent Issued to TOPCON on Sept. 30 for "Hammering test system" (Japanese Inventor)

ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,429,589, issued on Sept. 30, was assigned to TOPCON Corp. (Tokyo).

"Hammering test system" was invented by Takeshi Kikuchi (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A hammering test system includes a hammering test device including a target, a flying unit, and a hammering test mechanism configured to conduct a hammering test on a test object, a surveying instrument including a scanner for acquiring point cloud data by scanning with scanning light, and configured to be capable of performing tracking and distance and angle measurements of the target, and an arithmetic processing unit including a point cloud data analyzing unit configured to c...