US Patent Issued to TOPCON on Oct. 28 for "Surveying instrument, surveying method and surveying program" (Japanese Inventors)

ALEXANDRIA, Va., Oct. 28 -- United States Patent no. 12,455,164, issued on Oct. 28, was assigned to TOPCON Corp. (Tokyo).

"Surveying instrument, surveying method and surveying program" was invented by Fumio Ohtomo (Saitama, Japan), Takeshi Sasaki (Tokyo-to, Japan) and Kaoru Kumagai (Tokyo-to, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided is a surveying instrument including a distance measuring module configured to measure a distance to an object, an optical axis deflector configured to deflect the distance measuring light, a measuring direction image pickup module configured to acquire an observation image, an arithmetic control module, and an operation panel includes a display module, the ar...