US Patent Issued to TOPCON on Nov. 25 for "Slit lamp microscope, ophthalmic system, method of controlling slit lamp microscope, and recording medium" (Japanese Inventors)

ALEXANDRIA, Va., Nov. 25 -- United States Patent no. 12,478,252, issued on Nov. 25, was assigned to TOPCON Corp. (Tokyo).

"Slit lamp microscope, ophthalmic system, method of controlling slit lamp microscope, and recording medium" was invented by Hitoshi Shimizu (Tokyo), Kazuhiro Omori (Tokyo) and Hisashi Tsukada (Hachioji, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A slit lamp microscope of an aspect example includes a scanner, a controller, and an image set creation processor. The scanner is configured to scan an anterior segment of a subject's eye with slit light to collect an image group. The controller is configured to control the scanner to apply two or more scans to the anterior segment. The ...