US Patent Issued to TOPCON on Jan. 27 for "Surveying apparatus, surveying method, and surveying program" (Japanese Inventor)

ALEXANDRIA, Va., Jan. 28 -- United States Patent no. 12,535,319, issued on Jan. 27, was assigned to TOPCON Corp. (Tokyo).

"Surveying apparatus, surveying method, and surveying program" was invented by You Sasaki (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A technique for enabling efficient surveying operation that uses a light-reflecting target is provided. A surveying apparatus is configured to survey a reflecting prism and includes a controller, a surface calculator, and a position calculator. The controller performs positioning on three or more points on the set-up surface on which the reflecting prism is set up, by using laser light. The surface calculator calculates a plane of the set-up surfa...