US Patent Issued to TOPCON on Jan. 13 for "Bar arrangement inspection system and bar arrangement inspection method" (Japanese Inventor)

ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,524,870, issued on Jan. 13, was assigned to TOPCON Corp. (Tokyo).

"Bar arrangement inspection system and bar arrangement inspection method" was invented by Takeshi Kikuchi (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A bar arrangement inspection system includes a scanner for acquiring three-dimensional point cloud data of an inspection range, a camera for acquiring image data of the inspection range, a processor, and three-dimensional bar arrangement design data of the inspection range, the processor is configured to receive the three-dimensional point cloud data of the inspection range from the scanner and the image data of the inspection rang...