ALEXANDRIA, Va., Feb. 19 -- United States Patent no. 12,228,401, issued on Feb. 18, was assigned to TOPCON Corp. (Tokyo).
"Survey system" was invented by Takeshi Kikuchi (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "A survey system is provided which includes a surveying instrument capable of performing distance and angle measurements of a target attached to a pole, a controller as a glove-shaped wearable device to be worn on a hand of a worker, and configured to transmit commands to the surveying instrument from an input unit for inputting commands, and an eyewear device capable of performing display superimposed on a landscape. Measurement points are displayed by being synchronized with and superimp...