ALEXANDRIA, Va., Feb. 17 -- United States Patent no. D1,113,466, issued on Feb. 17, was assigned to TOPCON Corp. (Tokyo).
"Prism for measuring" was invented by Yasuhito Haijima (Tokyo), Yasushi Tanaka (Tokyo), Mitsuru Ogawa (Tokyo), Nobuyuki Nishita (Tokyo) and Yoshiyuki Daibo (Tokyo).
The patent was filed on Dec. 30, 2022, under Application No. D/869,409.
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