US Patent Issued to TOPCON on Feb. 10 for "Slit lamp microscope, ophthalmic information processing apparatus, ophthalmic system, method of controlling slit lamp microscope, and recording medium" (Japanese Inventors)

ALEXANDRIA, Va., Feb. 11 -- United States Patent no. 12,543,950, issued on Feb. 10, was assigned to TOPCON Corp. (Tokyo).

"Slit lamp microscope, ophthalmic information processing apparatus, ophthalmic system, method of controlling slit lamp microscope, and recording medium" was invented by Jonathan Liu (Tokyo), Hitoshi Shimizu (Tokyo) and Hisashi Tsukada (Hachioji, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A slit lamp microscope of an aspect example includes a scanner and a data processor. The scanner is configured to scan an anterior segment of a subject's eye with slit light to collect a plurality of cross sectional images. The data processor is configured to generate opacity distribution inform...