US Patent Issued to TOPCON, RIKEN on Nov. 11 for "Non-destructive inspection device and non- destructive inspection system" (Japanese Inventors)

ALEXANDRIA, Va., Nov. 11 -- United States Patent no. 12,467,889, issued on Nov. 11, was assigned to TOPCON Corp. (Tokyo) and RIKEN (Wako, Japan).

"Non-destructive inspection device and non- destructive inspection system" was invented by Shigenori Nagano (Tokyo), Satoshi Yanobe (Tokyo), Akira Yajima (Tokyo), Hanako Aikoh (Tokyo), Satoru Ishiguro (Tokyo), Yoshie Otake (Wako, Japan), Yasuo Wakabayashi (Wako, Japan) and Masato Takamura (Wako, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A non-destructive inspection system includes a non-destructive inspection apparatus and a management apparatus. The non-destructive inspection apparatus includes: a neutron emission unit capable of emitting a neutron beam...