ALEXANDRIA, Va., July 23 -- United States Patent no. 12,366,542, issued on July 22, was assigned to TOPCON Corp. (Tokyo) and RIKEN (Wako-shi, Japan).
"Nondestructive inspection system" was invented by Shigenori Nagano (Tokyo), Satoshi Yanobe (Tokyo), Akira Yajima (Tokyo), Hanako Aikoh (Tokyo), Satoru Ishiguro (Tokyo), Yoshie Otake (Wako, Japan), Yasuo Wakabayashi (Wako, Japan) and Masato Takamura (Wako, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "A non-destructive inspection system includes: a neutron emission unit capable of emitting neutrons having a first neutron dose; a neutron detection unit capable of detecting a second neutron dose of neutrons scattered inside an inspection object A by the em...