ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,430,785, issued on Sept. 30, was assigned to Tokyo Seimitsu Co. Ltd. (Tokyo).
"Shape measurement device" was invented by Taira Tsuru (Tsuchiura, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "[Solution] A shape measurement device for acquiring a plurality of surface images while scanning a surface of a plate-shaped measurement object 1 and measuring a shape of the measurement object 1 includes: an imaging system 10 that irradiates the measurement object 1 with parallel light and acquires the surface image; a stage system 30 that holds the measurement object 1 and adjusts an attitude of the measurement object 1 with respect to the imaging system 1...