US Patent Issued to Tokyo Electron on June 10 for "Abnormality detecting device and abnormality detecting method" (Japanese Inventor)

ALEXANDRIA, Va., June 18 -- United States Patent no. 12,327,186, issued on June 10, was assigned to Tokyo Electron Ltd. (Tokyo).

"Abnormality detecting device and abnormality detecting method" was invented by Takuro Tsutsui (Hokkaido, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An abnormality detection device trains a model using multiple network sections each configured to process acquired time series data sets and a concatenation section configured to combine output data output from each of the multiple network sections and to output, as a combined result, a result of combining the output data output from each of the multiple network sections. The trained model is then applied to adapt a unit of p...