US Patent Issued to TOHOKU UNIVERSITY on Nov. 18 for "Measurement device and measurement method for measuring permeability and permittivity" (Japanese Inventors)

ALEXANDRIA, Va., Nov. 18 -- United States Patent no. 12,474,299, issued on Nov. 18, was assigned to TOHOKU UNIVERSITY (Sendai, Japan).

"Measurement device and measurement method for measuring permeability and permittivity" was invented by Shin Yabukami (Sendai, Japan) and Kazuhiko Okita (Sendai, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "The measurement device for measuring permeability and permittivity of an object, includes a probe in which a signal transmission line is formed and on which the object is capable of being disposed close to or in contact with the signal transmission line; a magnetic-field application unit configured to apply a magnetic-field to the object; a signal measurement instr...