ALEXANDRIA, Va., June 25 -- United States Patent no. 12,339,261, issued on June 24, was assigned to TOFWERK AG (Thun, Switzerland).
"Method and apparatus for mass analysing a sample" was invented by Sonja Klee (Reutigen, Switzerland), Steffen Brakling (Thun, Switzerland), Marc Gonin (Thun, Switzerland), Urs Rohner (Thun, Switzerland) and Carsten Stoermer (Thun, Switzerland).
According to the abstract* released by the U.S. Patent & Trademark Office: "The invention relates to a method for mass analysing a sample by ionising the sample to first sample ions and to second sample ions and by obtaining mass spectra from the first sample ions and the second sample ions with a mass analyser (5). Thereby, repeatedly, a first assay is obtained from ...