US Patent Issued to Tianjin University on June 24 for "Device for low stress triaxial testing" (Chinese Inventors)

ALEXANDRIA, Va., June 25 -- United States Patent no. 12,339,257, issued on June 24, was assigned to Tianjin University (Tianjin, China).

"Device for low stress triaxial testing" was invented by Yue Yan (Tianjin, China), Jiachong Ma (Tianjin, China) and Dengfeng Fu (Tianjin, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A device for a low stress triaxial test includes a test platform; a pressure chamber disposed on the test platform; a base disposed on the pressure chamber and fixed to the test platform; a support disposed on the test platform; a servo motor disposed on the support; a loading piston connected to the servo motor and penetrating into the pressure chamber; an axial force sensor disposed o...