ALEXANDRIA, Va., Sept. 17 -- United States Patent no. 12,416,590, issued on Sept. 16, was assigned to Thermo Fisher Scientific Messtechnik GmbH (Erlangen, Germany).
"Substrate alloy influence compensation" was invented by Alexander Britting (Lauf a. d. Pegnitz, Germany).
According to the abstract* released by the U.S. Patent & Trademark Office: "A method for compensating for substrate variation in measurement of material quantity of a material positioned on a substrate is described. The method includes receiving a detected X-ray signal for a measurement of the material at a position on a surface of the substrate; and determining a material quantity based on the received X-ray measurement signal and a pre-determined set of compensation par...