ALEXANDRIA, Va., Feb. 19 -- United States Patent no. 12,230,023, issued on Feb. 18, was assigned to The University of Tokyo (Tokyo) and Osaka University (Osaka, Japan).
"Analysis device" was invented by Sadao Ota (Tokyo), Issei Sato (Tokyo), Katsuhito Fujiu (Tokyo), Satoko Yamaguchi (Tokyo), Kayo Waki (Tokyo), Yoko Itahashi (Tokyo) and Ryoichi Horisaki (Osaka, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "An analysis device includes an analysis unit configured to receive scattered light, transmitted light, fluorescence, or electromagnetic waves from an observed object located in a light irradiation region light-irradiated from a light source and analyze the observed object on the basis of a signal ext...