ALEXANDRIA, Va., Feb. 3 -- United States Patent no. 12,541,964, issued on Feb. 3, was assigned to The Trustees of Columbia University in the City of New York (New York).

"Adaptable automated interpretation of rapid diagnostic tests using self-supervised learning and few-shot learning" was invented by Samuel K. Sia (New York), Shih-Fu Chang (New York), Siddarth Arumugam (New York), Uzay Macar (New York), Jiawei Ma (New York), Guangxing Han (New York) and David Colburn (New York).

According to the abstract* released by the U.S. Patent & Trademark Office: "A framework for a few-shot learning method is disclosed. In a first part, self-supervision and classification supervision are used to train a feature extractor. An example self-supervision...