US Patent Issued to The Texas A&M University System on Dec. 23 for "Systems and methods for measuring light beam scattering" (Texas, Michigan, California Inventors)

ALEXANDRIA, Va., Dec. 23 -- United States Patent no. 12,504,372, issued on Dec. 23, was assigned to The Texas A&M University System (College Station, Texas).

"Systems and methods for measuring light beam scattering" was invented by Junhwi Bak (College Station, Texas), Yue Wu (Mission Viejo, Calif.), Richard Bryant Miles (Bryan, Texas) and Christopher M. Limbach (Ann Arbor, Mich.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A system for measurement of light scattering from a test article includes a light emitting device, configured to emit a light beam onto the test article along light axis, a collection assembly configured to collect scattered light from the test article along a measurement axis that is or...