ALEXANDRIA, Va., June 17 -- United States Patent no. 12,315,117, issued on May 27, was assigned to THE INSTITUTE OF OPTICS AND ELECTRONICS, THE CHINESE ACADEMY OF SCIENCES (Sichuan, China).

"Illumination field non-uniformity detection system, detection method, correction method, and device" was invented by Xiangang Luo (Sichuan, China), Lixin Zhao (Sichuan, China), Yu He (Sichuan, China), Yi Li (Sichuan, China), Sihan Wu (Sichuan, China), Jinhua Feng (Sichuan, China), Hongyu Shao (Sichuan, China) and Shaoyu Zhang (Sichuan, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided are illumination field non-uniformity detection system, detection method, correction method, and device provided. The system i...