US Patent Issued to The Board of Trustees of the Leland Stanford Junior University on Aug. 5 for "Single shot analyzer grating for differential phase contrast X-ray imaging and computed tomography" (California Inventors)

ALEXANDRIA, Va., Aug. 6 -- United States Patent no. 12,379,331, issued on Aug. 5, was assigned to The Board of Trustees of the Leland Stanford Junior University (Stanford, Calif.).

"Single shot analyzer grating for differential phase contrast X-ray imaging and computed tomography" was invented by Max Yuen (San Francisco), Yao-Te Cheng (Sunnyvale, Calif.), Paul Christopher Hansen (Palo Alto, Calif.) and Lambertus Hesselink (Atherton, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "In accordance with the invention, an X-ray amplitude analyzer grating adapted for use in an interferometric imaging system, the interferometric imaging system comprising an X-ray source and an X-ray detector with an X-ray frin...