US Patent Issued to Texas Instruments on Sept. 23 for "Calibration of circuitry parameters for current sensing" (Chinese Inventors)

ALEXANDRIA, Va., Sept. 23 -- United States Patent no. 12,422,488, issued on Sept. 23, was assigned to Texas Instruments Inc. (Dallas).

"Calibration of circuitry parameters for current sensing" was invented by Yicheng Zhou (Shanghai), Xiaodong Li (Shanghai) and Kangcheng Xu (Shanghai).

According to the abstract* released by the U.S. Patent & Trademark Office: "Various examples disclosed herein relate to current sensing via current sensing circuitry, and more particularly, to calibrating current sensing circuitry to dynamically detect current ranges across a load. In an example embodiment, a microcontroller unit (MCU) is provided herein that includes a processor and current sensing circuitry coupled to the processor. The current sensing cir...