ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,445,038, issued on Oct. 14, was assigned to TEXAS INSTRUMENTS Inc. (Dallas).
"Turn on delay measurements for capacitive load" was invented by Vasishta Kidambi (Hyderabad, India), Harsh Patel (Mumbai, India), Aalok Dyuti Saha (Bangalore, India) and Subrato Roy (Bangalore, India).
According to the abstract* released by the U.S. Patent & Trademark Office: "One example includes a testing method that includes connecting a capacitor having a first capacitance to an output terminal of an integrated circuit (IC). The method can also include generating pulse signal responsive to an enable signal provided at at least one input terminal of the IC and providing a drive signal to the output termi...