US Patent Issued to Texas Instruments on Nov. 18 for "Envelope based sample correction for digital flow metrology" (Texas Inventors)

ALEXANDRIA, Va., Nov. 18 -- United States Patent no. 12,474,190, issued on Nov. 18, was assigned to Texas Instruments Inc. (Dallas).

"Envelope based sample correction for digital flow metrology" was invented by Amardeep Sathyanarayana (Austin, Texas), Anand G. Dabak (Plano, Texas) and David Patrick Magee (Allen, Texas).

According to the abstract* released by the U.S. Patent & Trademark Office: "In an embodiment, a system for measuring material flow in a pipe is disclosed. A first transducer is operable to transmit a first signal having a first frequency at a first time and receive a second signal at a second time, and a second transducer spaced apart from the first transducer and is operable to receive the first signal and transmit the se...