US Patent Issued to TEXAS INSTRUMENTS on Nov. 11 for "Scan testing using scan frames with embedded commands" (Texas Inventor)

ALEXANDRIA, Va., Nov. 11 -- United States Patent no. 12,467,971, issued on Nov. 11, was assigned to TEXAS INSTRUMENTS Inc. (Dallas).

"Scan testing using scan frames with embedded commands" was invented by Lee D. Whetsel (Parker, Texas).

According to the abstract* released by the U.S. Patent & Trademark Office: "Testing of integrated circuits is achieved by a test architecture utilizing a scan frame input shift register, a scan frame output shift register, a test controller, and a test interface comprising a scan input, a scan clock, a test enable, and a scan output. Scan frames input to the scan frame input shift register contain a test stimulus data section and a test command section. Scan frames output from the scan frame output shift r...