ALEXANDRIA, Va., June 17 -- United States Patent no. 12,313,667, issued on May 27, was assigned to TEXAS INSTRUMENTS Inc. (Dallas).
"Integrated circuit die test architecture" was invented by Lee D. Whetsel (Parker, Texas).
According to the abstract* released by the U.S. Patent & Trademark Office: "A test control port (TCP) includes a state machine SM, an instruction register IR, data registers DRs, a gating circuit and a TDO MX. The SM inputs TCI signals and outputs control signals to the IR and to the DR. During instruction or data scans, the IR or DRs are enabled to input data from TDI and output data to the TDO MX and the top surface TDO signal. The bottom surface TCI inputs may be coupled to the top surface TCO signals via the gating ...