US Patent Issued to TEXAS INSTRUMENTS on May 27 for "Identifying defect sensitive codes for testing devices with input or output code" (Indian Inventors)

ALEXANDRIA, Va., June 17 -- United States Patent no. 12,313,681, issued on May 27, was assigned to TEXAS INSTRUMENTS Inc. (Dallas).

"Identifying defect sensitive codes for testing devices with input or output code" was invented by Lakshmanan Balasubramanian (Bengaluru, India), Nadeem Husain Tehsildar (Bengaluru, India), Rubin Ajit Parekhji (Bengaluru, India), Suresh Mallala (Hyderbad, India) and Nitin Agarwal (Bengaluru, India).

According to the abstract* released by the U.S. Patent & Trademark Office: "In one embodiment, a method of operating a computational system to evaluate a device under test, where the device under test is operable to receive a digital code input and output in response a corresponding output. The method injects a pl...