ALEXANDRIA, Va., June 17 -- United States Patent no. 12,317,519, issued on May 27, was assigned to TEXAS INSTRUMENTS Inc. (Dallas).
"Contaminant collection on SOI" was invented by Honglin Guo (Dallas), Zachary K Lee (Fremont, Calif.) and Jingjing Chen (Santa Clara, Calif.).
According to the abstract* released by the U.S. Patent & Trademark Office: "An integrated circuit includes an SOI substrate having a semiconductor layer over a buried insulator layer; the semiconductor layer contains white space regions that include a PWELL region. An electronic device includes an NWELL region in the semiconductor layer, a dielectric over the NWELL region, and a polysilicon plate over the dielectric. A sacrificial NWELL ring is adjacent to and separate...