US Patent Issued to Texas Instruments on May 13 for "Process control system including process condition determination using attribute-relative process condition" (Chinese Inventors)

ALEXANDRIA, Va., June 12 -- United States Patent no. 12,300,552, issued on May 13, was assigned to Texas Instruments Inc. (Dallas).

"Process control system including process condition determination using attribute-relative process condition" was invented by Shuqian Huang (Chengdu, China), Sheng Zou (Chengdu, China), Yuchen Li (Chengdu, China), Peng Li (Chengdu, China), Chao Zhuang (Chengdu, China) and Zhiyun Liu (Chengdu, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure generally relates to determining a process condition in a semiconductor process using attribute-relative process conditions. An example is a method of forming an integrated circuit (IC). First and second historical ...