US Patent Issued to TEXAS INSTRUMENTS on March 4 for "At-speed test of functional memory interface logic in devices" (Texas Inventors)

ALEXANDRIA, Va., March 5 -- United States Patent no. 12,243,603, issued on March 4, was assigned to TEXAS INSTRUMENTS Inc. (Dallas).

"At-speed test of functional memory interface logic in devices" was invented by Devanathan Varadarajan (Allen, Texas) and Lei Wu (Sugar Land, Texas).

According to the abstract* released by the U.S. Patent & Trademark Office: "Methods to test functional memory interface logic of a core under test utilize a built-in-self-test (BIST) controller to generate test sequences, and a clock-gating circuit to selectively supply the test sequences to a memory input or memory output on the core under test. After an initial data initialization of the core under test at BIST mode, an at-speed functional mode is utilized to...