US Patent Issued to Texas Instruments on July 8 for "Calibration in non-linear multi-stage delay-to-digital conversion circuits" (Indian Inventors)

ALEXANDRIA, Va., July 9 -- United States Patent no. 12,355,460, issued on July 8, was assigned to Texas Instruments Inc. (Dallas).

"Calibration in non-linear multi-stage delay-to-digital conversion circuits" was invented by Sourya Dewan (Bangalore, India), Visvesvaraya Appala Pentakota (Bangalore, India), Rishi Soundararajan (Bangalore, India) and Shagan Dusad (Bangalore, India).

According to the abstract* released by the U.S. Patent & Trademark Office: "A delay-domain analog-to-digital converter including a voltage-to-delay circuit and a time-to-digital converter circuit, and a method of calibrating the same. The voltage-to-delay circuit generates a delay signal based on applied calibration voltage, and the delay signal is applied to a f...