ALEXANDRIA, Va., July 30 -- United States Patent no. 12,372,565, issued on July 29, was assigned to Texas Instruments Inc. (Dallas).

"Methods and apparatus for determining parasitic capacitances" was invented by Aatish Chandak (Bengaluru, India), Aravind Miriyala (Bengaluru, India), Midhun Raveendran (Bengaluru, India), Anand Hariraj Udupa (Bengaluru, India), Raja Reddy Patukuri (Bengaluru, India) and Prabin Krishna Yadav (Bengaluru, India).

According to the abstract* released by the U.S. Patent & Trademark Office: "An example apparatus includes: calibration circuitry configured to determine a second current at a second terminal of a second impedance circuit based on a first parasitic capacitance, a first impedance value, a third impedanc...